Growth paths in polycrystalline thin films

Dana Zöllner
DOI: https://doi.org/10.1088/1361-651x/ad2af4
IF: 2.421
2024-02-22
Modelling and Simulation in Materials Science and Engineering
Abstract:The polycrystalline grain microstructure of metallic thin films coarsens during grain growth in a unique way when the initial grain structure contains multiple grains in the firm thickness. A regime with fast coarsening is followed by a regime of slow coarsening. At the same time the grain structure itself undergoes clear structural changes from a bulk-like to a bamboo-like structure. The overall coarsening process evolves continuously, whereas the growth paths of individual grains do not follow the ones observed and predicted in either two- or three-dimensional grain growth.
materials science, multidisciplinary,physics, applied
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