Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs

Claudio E. Calosso,A. Carolina Cárdenas Olaya,Enrico Rubiola
DOI: https://doi.org/10.1109/TUFFC.2019.2943390
2019-06-12
Abstract:This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for the analyzer to feature AN measurement. An obvious variant enables AN and PN measurements using an AN analyzer with no PN measurement capability. Such instrument is extremely simple and easy to implement with a power-detector diode followed by a FFT analyzer. Unlike the classical bridge (interferometric) method, there is no need for external line stretcher and variable attenuators because phase and amplitude control is implemented in the device under test. In one case (AD9144), we could measure the noise over 10 decades of frequency. The flicker noise matches the exact $1/f$ law with a maximum discrepancy of $\pm1$ dB over 7.5 decades. Thanks to simplicity, reliability, and low background noise, this method has the potential to become the standard method for the AN and PN measurement of DACs and DDSs.
Instrumentation and Detectors,Atomic Physics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is the measurement of phase noise (PN) and amplitude noise (AN) of digital - to - analog converters (DACs) and direct digital synthesizers (DDSs). Specifically, the paper proposes a method based on modulation - index amplification to measure the PN and AN of these devices. This method makes it possible to use traditional PN analyzers or AN analyzers for measurement by reducing the carrier power (by about 30 - 40 dB) and then amplifying the remaining carrier and noise sidebands. The main contributions of the paper are as follows: 1. **Relaxing the requirements for PN analyzers**: Due to the improvement of the carrier - to - suppression ratio, the noise specifications of PN analyzers can be relaxed. 2. **Using PN analyzers to measure AN**: Even if the PN analyzer does not have the function of measuring AN, the measurement of AN can be achieved through this method. 3. **Using AN analyzers to measure PN and AN**: Even if the AN analyzer does not have the ability to measure PN, PN and AN can be simultaneously measured through this method. In addition, the paper also describes in detail the principle and method of modulation - index amplification and verifies the effectiveness of this method through experiments. This method has the advantages of simplicity, reliability and low background noise in practical applications and is expected to become the standard method for PN and AN measurement of DACs and DDSs.