Abstract:Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. A spatial resolution of 10-100 nm is routinely achieved in s-SNOM based on amplitude-modulation atomic force microscopy (AM-AFM) with tapping amplitudes of tens of nanometers. However, optical imaging and spectroscopy of structures that are localized to the atomic scale remain a significant challenge. This can be overcome by combining the field enhancement localized at the atomic-scale structure of the tip apex, namely a plasmonic picocavity, with frequency-modulationAFM (FM-AFM), namely non-contact AFM, in a stable cryogenic ultrahigh vacuum environment. Here, we developed picocavityenhanced SNOM (PE-SNOM) under visible laser illumination based on the integration of a quartz tuning fork sensor with small-amplitude oscillations of 1 nm or less. In addition, the use of a focused ion beam-polished silver tip mounted on the sensor leads to strong field enhancement in the picocavity and ensures minimal background scattering from the tip shaft. PE-SNOM allows us to obtain a material-contrast image of silicon islands on a silver surface with 1-nm lateral resolution, which surpasses the conventional limits of s-SNOM. PE-SNOM paves the way for the acquisition of optical information from atomic-scale targets, such as single photo-active defects and molecules.

Near-Field Scanning Microwave Microscopy in the Single Photon Regime

High-sensitivity Quantitative Phase Microcopy (conference Presentation)

High-Sensitivity Quantitative Phase Microcopy

Atomic-force-microscope-compatible Near-Field Scanning Microwave Microscope with Separated Excitation and Sensing Probes

Low terahertz-band scanning near-field microscope with 155-nm resolution

Cryogenic microwave source based on nanoscale tunnel junctions

Near-ideal Microwave Photon to Electron Conversion in a High Impedance Quantum Circuit

Proposal for an Optomechanical Microwave Sensor at the Subphoton Level

Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy

A cavity-microscope for micrometer-scale control of atom-photon interactions

Near-field terahertz probes with room-temperature nanodetectors for subwavelength resolution imaging

Quantum Inspired Microwave Phase Super-Resolution at Room Temperature

Quantum Modeling of Scanning Near-Field Optical photons Scattered by an Atomic-Force Microscope Tip for Quantum Metrology

Picocavity-enhanced near-field optical microscopy with 1 nm resolution

Microwave impedance microscopy and its application to quantum materials

A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

Measuring nanomechanical motion with a microwave cavity interferometer

Microwave single-photon detection using a hybrid spin-optomechanical quantum interface

Microwave photon detection at parametric criticality

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

Near-field optical microscopy with a nanodiamond-based single photon tip