Development of the multiplex imaging chamber at PAL‐XFEL

Junha Hwang,Sejin Kim,Sung Yun Lee,Eunyoung Park,Jaeyong Shin,Jae Hyuk Lee,Myong-jin Kim,Seonghan Kim,Sang-Youn Park,Dogeun Jang,Intae Eom,Sangsoo Kim,Changyong Song,Kyung Sook Kim,Daewoong Nam
DOI: https://doi.org/10.1107/s1600577524001218
IF: 2.557
2024-03-23
Journal of Synchrotron Radiation
Abstract:A new instrument that can collect small‐/wide‐angle X‐ray diffraction and X‐ray emission spectra simultaneously to probe the physical and chemical structures of specimens is introduced.Various X‐ray techniques are employed to investigate specimens in diverse fields. Generally, scattering and absorption/emission processes occur due to the interaction of X‐rays with matter. The output signals from these processes contain structural information and the electronic structure of specimens, respectively. The combination of complementary X‐ray techniques improves the understanding of complex systems holistically. In this context, we introduce a multiplex imaging instrument that can collect small‐/wide‐angle X‐ray diffraction and X‐ray emission spectra simultaneously to investigate morphological information with nanoscale resolution, crystal arrangement at the atomic scale and the electronic structure of specimens.
optics,physics, applied,instruments & instrumentation
What problem does this paper attempt to address?