Abstract:A protocol is presented for accurately quantifying the quantum yield of persistent phosphors, enabling precise performance comparisons. Applied to different phosphors, it reveals a trade‐off between efficiency and brightness, aiding in the selection of appropriate charging conditions. It facilitates the design of persistent materials beyond trial‐and‐error approaches by contributing to the development of standardized characterization tools for the analysis of afterglow mechanisms. Accurate quantification of efficiency enables rigorous comparison between different photoluminescent materials, providing an optimization path critical to the development of next‐generation light sources. Persistent luminescent materials exhibit delayed and long‐lasting luminescence due to the temporary storage of optical energy in engineered structural defects. Standard characterization methods do not provide a universal comparison of phosphor performance, hindering the evaluation of the efficiency of the various processes involved in afterglow. Here, a protocol is established to determine the quantum yield of persistent phosphors by considering the ratio of photons emitted in the afterglow and during charging to those absorbed. The method is first applied to transparent single crystals of the most common persistent phosphors, such as SrAl2O4:Eu2+,Dy3+ and Y3Al2Ga3O12:Ce3+,Cr3+. The versatility of the methodology is demonstrated by quantifying the quantum yield of a ZnGa2O4:Cr3+ thin film, a material widely used in in vivo imaging. The high efficiency of strontium aluminate is confirmed, and a strong dependence of the obtained values on the illumination conditions is revealed, highlighting a trade‐off between efficiency and brightness. The results contribute to the development of standardized protocols for analyzing afterglow mechanisms and assessing overall efficiency, facilitating rigorous comparison and optimization of persistent materials beyond trial‐and‐error approaches.

Improving Light Yield Measurements for Low-Yield Scintillators

Scintillator light yield measurements with waveform digitizers

Absolute light yield of the EJ-204 plastic scintillator

Measurement of the scintillation yield of low-energy electrons in liquid xenon

Characterization of water-based liquid scintillator for Cherenkov and scintillation separation

Light propagation and fluorescence quantum yields in liquid scintillators

Light-yield response of liquid scintillators using 2--6 MeV tagged neutrons

Light-yield response of liquid scintillators using 2–6 MeV tagged neutrons

Performance of a Ton-scale Water-based Liquid Scintillator Detector

Time Response of Water-based Liquid Scintillator from X-ray Excitation

Search for new scintillators by studying the fluorescence properties of powdered compounds with synchrotron radiation

Cherenkov and Scintillation Light Separation Using Wavelength in LAB Based Liquid Scintillator

Low Energy Light Yield of Fast Plastic Scintillators

Light yield of Perovskite nanocrystal-doped liquid scintillator

Measurements of Scintillation Characteristics of Pbwo4 Crystals

Measurements and optimization of the light yield of a TeO$_2$ crystal

Quantification of Emission Efficiency in Persistent Luminescent Materials

Temperature dependence of the light yield of the LAB-based and mesitylene-based liquid scintillators

Light yield measurements for PbWO4 crystals by single photoelectron method

Measurement of the fluorescence quantum yield of bis-MSB