Band alignments of electronic energy structure in epitaxially grown \b{eta}-Ga2O3 layers

D.A. Zatsepin,D.W. Boukhvalov,A.F. Zatsepin,Yu. A. Kuznetsova,D. Gogova,V.Ya. Shur,A.A. Esin
DOI: https://doi.org/10.48550/arXiv.1801.09451
2018-01-29
Abstract:Gallium oxide epitaxial layers grown on native substrates and basal plane sapphire were characherized by X-ray phtotelectron and optical reflectance spectroscopies. The XPS electronic structure mapping was coupled to Density functional theory calculations.
Materials Science
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