Structural and electronic characterization of the precipitate phase in deformed Cu–13.81%Mn–3.78%Al alloy

Aldirmaz, E.
DOI: https://doi.org/10.1007/s10854-024-13491-7
2024-09-17
Journal of Materials Science Materials in Electronics
Abstract:In this paper, crystallographic, morphological, mechanical, thermomechanical, and electronic properties of Cu–13.81%Mn–3.78%Al (wt.%) alloy has been investigated under various conditions by distinct physical methods. Please check and confirm the edit made in the article title. As a result of surface and crystallographic investigations; precipitate phase is observed in the alloy. A Schottky diode based on Cu–Mn–Al alloy was fabricated. The electrical properties of the Schottky diode were investigated using transient photocurrent, photoconductivity and photocapacitance analysis. Electrical properties showed sensitivity to different illumination intensities and frequencies. The Schottky diode showed negative capacitance (N.C.) behavior at reverse bias. This behavior is due to the loss of interface charges.
engineering, electrical & electronic,materials science, multidisciplinary,physics, condensed matter, applied
What problem does this paper attempt to address?