Abstract:We present a novel technique to monitor dynamics in interfacial systems through temporal correlations in x-ray photoelectron spectroscopy (XPS) signals. To date, the vast majority of time-resolved x-ray spectroscopy techniques rely on pump–probe schemes, in which the sample is excited out of equilibrium by a pump pulse, and the subsequent dynamics are monitored by probe pulses arriving at a series of well-defined delays relative to the excitation. By definition, this approach is restricted to processes that can either directly or indirectly be initiated by light. It cannot access spontaneous dynamics or the microscopic fluctuations of ensembles in chemical or thermal equilibrium. Enabling this capability requires measurements to be performed in real (laboratory) time with high temporal resolution and, ultimately, without the need for a well-defined trigger event. The time-correlation XPS technique presented here is a first step toward this goal. The correlation-based technique is implemented by extending an existing optical-laser pump/multiple x-ray probe setup by the capability to record the kinetic energy and absolute time of arrival of every detected photoelectron. The method is benchmarked by monitoring energy-dependent, periodic signal modulations in a prototypical time-resolved XPS experiment on photoinduced surface-photovoltage dynamics in silicon, using both conventional pump–probe data acquisition, and the new technique based on laboratory time. The two measurements lead to the same result. The findings provide a critical milestone toward the overarching goal of studying equilibrium dynamics at surfaces and interfaces through time correlation-based XPS measurements.

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Time-resolved Ellipsometry for Studies of Heat Transfer at Liquid/solid and Gas/solid Interfaces.

Transient Lattice Deformations of Crystals Studied by Means of Ultrafast Time-Resolved X-Ray and Electron Diffraction

Time-Resolved Structural Dynamics of Thin Metal Films Heated with Femtosecond Optical Pulses

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(Sub-)picosecond surface correlations of femtosecond laser excited Al-coated multilayers observed by grazing-incidence x-ray scattering

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Ballistic-phonon Heat Conduction at the Nanoscale As Revealed by Time-Resolved X-Ray Diffraction and Time-Domain Thermoreflectance

Atomic-scale imaging of laser-driven electron dynamics in solids

Combined Hydrodynamic and Diffraction Simulations of Femtosecond X-ray Scattering from Laser-Shocked Crystals

Ultrafast lattice deformations studied by means of time-resolved electron and x-ray diffraction

Time-resolved reflection surface x-ray diffraction

Real-space observation of surface structuring induced by ultra-fast-laser illumination far below the melting threshold

Harmonizing sound and light: X-ray imaging unveils acoustic signatures of stochastic inter-regime instabilities during laser melting

Towards Time-Resolved Atomic Structure Determination by X-Ray Standing Waves at a Free-Electron Laser

Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition

Nanoscale subsurface dynamics of solids upon high-intensity laser irradiation observed by femtosecond grazing-incidence x-ray scattering

Direct measurement of non-equilibrium phonon occupations in femtosecond laser heated Au films

Real-time interfacial electron dynamics revealed through temporal correlations in x-ray photoelectron spectroscopy

Dynamics of Nanoscale Phase Decomposition in Laser Ablation

Transient ablation topography of a thin chromium film after ultrashort pulsed laser irradiation in the spallation and phase explosion regime