Thickness characterization of atomically-thin WSe$_2$ on epitaxial graphene by low-energy electron reflectivity oscillations

Sergio C. de la Barrera,Yu-Chuan Lin,Sarah M. Eichfeld,Joshua A. Robinson,Qin Gao,Michael Widom,Randall M. Feenstra
DOI: https://doi.org/10.1116/1.4954642
2016-06-14
Abstract:In this work, low-energy electron microscopy is employed to probe structural as well as electronic information in few-layer WSe$_2$ on epitaxial graphene on SiC. The emergence of unoccupied states in the WSe$_2$--graphene heterostructures are studied using spectroscopic low-energy electron reflectivity. Reflectivity minima corresponding to specific WSe$_2$ states that are localized between the monolayers of each vertical heterostructure are shown to reveal the number of layers for each point on the surface. A theory for the origin of these states is developed and utilized to explain the experimentally observed featured in the WSe$_2$ electron reflectivity.
Mesoscale and Nanoscale Physics
What problem does this paper attempt to address?