Evidence for universal relationship between the measured 1/f permittivity noise and loss tangent created by tunneling atoms

A. N. Ramanayaka,B. Sarabi,K. D. Osborn
DOI: https://doi.org/10.48550/arXiv.1507.06043
2015-07-22
Abstract:Noise from atomic tunneling systems (TSs) limit the performance of various resonant devices, ranging in application from astronomy detectors to quantum computing. Using devices containing these TSs, we study the $1/f$ permittivity noise and loss tangent in two film types containing different TS densities. The noise reveals an intrinsic value as well as the crossover to power-saturated noise. The intrinsic $1/f$ noise fits to the temperature dependence $1/T^{1+\mu}$ where $0.2\le\mu\le0.7$, which is related to previous studies and strongly interacting TS. An analysis of the noise normalized by the loss tangent and temperature is quantitatively identical for two film types, despite a factor of 5 difference in their loss tangent. Following from the broad applicability of the TS model, the data supports a universal relationship for amorphous-solid produced permittivity noise. The quantity of the observed noise particularly supports a recent model in which noise is created by weak TS-TS interactions.
Superconductivity,Mesoscale and Nanoscale Physics
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