Phase-sensitive optical pulse characterization on a chip via Spectral Phase Interferometry for Direct Electric-Field Reconstruction (SPIDER)

Alessia Pasquazi,Marco Peccianti,Yongwoo Park,Brent E. Little,Sai T. Chu,Roberto Morandotti,Jose Azana,David J. Moss
DOI: https://doi.org/10.1038/NPHOTON.2011.199
2014-04-22
Abstract:The recent introduction of coherent optical communications has created a compelling need for ultra-fast phase-sensitive measurement techniques operating at milliwatt peak power levels and in time scales ranging from sub-picoseconds to nanoseconds. Previous reports of ultrafast optical signal measurements in integrated platforms[8-10] include time-lens temporal imaging on a silicon chip[8,9] and waveguide-based Frequency-Resolved Optical Gating (FROG). Time-lens imaging is phase insensitive while waveguide-based FROG methods require the integration of long tuneable delay lines - still an unsolved challenge. Here, we report a device capable of characterizing both the amplitude and phase of ultrafast optical pulses with the aid of a synchronized incoherently-related clock pulse. It is based on a novel variation of Spectral Phase Interferometry for Direct Electric-Field Reconstruction (SPIDER)that exploits degenerate four-wave-mixing (FWM) in a CMOS compatible chip. We measure pulses with <100mW peak power, a frequency bandwidth >1THz, and up to 100ps pulsewidths, yielding a time-bandwidth product (TBP)>100.
Optics
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