Reverse Recovery Enhanced and Single-Event Effects Hardened Power Schottky Source MOSFET With Integrated Retrograde p-Well Schottky Contact Super Barrier Rectifier

Qisheng Yu,Wensuo Chen,Aohang Zhang,Jiaweiwen Huang
DOI: https://doi.org/10.1109/ted.2024.3379156
IF: 3.1
2024-01-01
IEEE Transactions on Electron Devices
Abstract:In this article, a new silicon power Schottky source MOSFET (S-MOS) architecture is proposed by introducing an integrated retrograde p-well Schottky contact super barrier rectifier (SBR), referred to as RP-SSBR-S-MOS. The introduced built-in Schottky contact SBR (SSBR) is a unipolar conduction device with a low forward conduction voltage that attenuates the minority carrier injection from the parasitic p-i-n body diode, resulting in excellent reverse recovery characteristics for the proposed RP-SSBR-S-MOS. In addition, by introducing a retrograde p-well structure and reducing the thin gate oxide length for the internal SSBR, the single-event gate rupture (SEGR) performance of the new MOSFET is significantly improved. Furthermore, the novel MOSFET replaces the ohmic contact N $^{+}$ source with a Schottky contact between the P-body and the source metal, eliminating the parasitic BJT structure, resulting in excellent single event burnout (SEB) resistance. In summary, the proposed RP-SSBR-S-MOS not only exhibits excellent resistance to single-event effects (SEEs) (SEGR and SEB) but also demonstrates outstanding reverse recovery performance. The new concept of the proposed device and its characteristics are systematically analyzed with numerical TCAD simulations.
engineering, electrical & electronic,physics, applied
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