Selected Area Manipulation of MoS 2 via Focused Electron Beam-Induced Etching for Nanoscale Device Editing

John Lasseter,Spencer Gellerup,Sujoy Ghosh,Seok Joon Yun,Rama Vasudevan,Raymond R. Unocic,Olugbenga Olunloyo,Scott T. Retterer,Kai Xiao,Steven J. Randolph,Philip D. Rack
DOI: https://doi.org/10.1021/acsami.3c17182
IF: 9.5
2024-02-14
ACS Applied Materials & Interfaces
Abstract:We demonstrate direct-write patterning of single and multilayer MoS(2) via a focused electron beam-induced etching (FEBIE) process mediated with the XeF(2) precursor. MoS(2) etching is performed at various currents, areal doses, on different substrates, and characterized using scanning electron and atomic force microscopies as well as Raman and photoluminescence spectroscopies. Scanning transmission electron microscopy reveals a sub-40 nm etching resolution and the progression of point defects...
materials science, multidisciplinary,nanoscience & nanotechnology
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