Effects of lateral device size and material properties on the ferromagnetic resonance response of spinwave eigen-modes in magnetic devices

Kwaku Eason,Maria Sabino,Michael Tran,Yun Fook Liew

DOI: https://doi.org/10.48550/arXiv.1212.6835

2012-12-31

Abstract:We analyze the effects of lateral device size and magnetic material parameters on the ferromagnetic resonance (FMR) response. Results presented are directly relevant to widely used FMR experimental techniques for extracting magnetic parameters from thin films, the results of which are often assumed to carry over to corresponding nanometer-sized patterned devices. We show that there can be significant variation in the FMR response with device size, and that the extent of the variation depends on the magnetic material properties. This explains, for example, why different experiments along these lines have yielded different size-dependent trends from damping measurements. Observed trends with increasing size and different material parameters are explained through the evolution of three distinct eigen-modes, demonstrating the respective roles of demagnetization and exchange. It is also shown that there is a crossover of dominant eigen-modes in the response signal, accompanied by conjugating edge-type modes, leading to evident effects in measured linewidth and damping. Among the sizes considered, in higher saturation magnetization, we observe as much as a 40% increase in apparent damping, due solely to device size variation.

Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

The aim of this paper is to solve the following problems:

### Research Background
Ferromagnetic Resonance (FMR) is a technique widely used to extract static and dynamic parameters of magnetic materials, such as magnetic anisotropy, effective magnetization intensity, g - factor and damping parameter α. These parameters are crucial for the performance of data storage devices (such as hard disk drives (HDD) and spin - transfer - torque magnetoresistive random - access memory (STT - MRAM)). However, traditional FMR measurements are usually carried out on relatively large thin - film samples, while the characteristic sizes of modern magnetic devices have been reduced to the nanometer level. Therefore, a key question is: **Can the FMR measurement results on large thin films accurately reflect the characteristics of nanometer - scale devices?**

### Objectives of the Paper
Through three - dimensional Finite Element Method (FEM) simulations, this paper studies the influence of lateral size and magnetic material parameters on the ferromagnetic resonance response. Specifically, the paper attempts to answer the following questions:
1. **How does the change in lateral size affect the FMR response?**
2. **What is the impact of different magnetic material parameters (such as saturation magnetization Ms) on the FMR response?**
3. **Why do different experiments observe different size - dependent trends?**

### Main Findings
1. **Significant Size Effect**: As the device size decreases, the FMR response shows significant changes. In particular, at smaller sizes, the differences caused by different material parameters are more obvious.
2. **Evolution of Three Spin - Wave Eigenmodes**: The paper shows three different spin - wave eigenmodes (uniform mode U, edge mode E and center mode C) and their evolution processes with size changes. The transitions of these modes explain the changes in resonance frequency, linewidth and apparent damping parameter α.
3. **Change in Apparent Damping Parameter α**: In the case of high saturation magnetization, due to the change in device size, the apparent damping parameter α can increase by as much as 40%. This indicates that at the nanoscale, traditional FMR measurements may not accurately reflect the actual damping behavior.

### Conclusions
Through detailed simulation analysis, the paper reveals the complex influence of lateral size and material parameters on the FMR response. These findings are helpful for understanding the dynamic behavior of nanometer - scale magnetic devices and provide theoretical guidance for future experimental designs. In particular, the paper emphasizes the influence of size effects and material characteristics that need to be considered when performing FMR measurements at the nanoscale.

### Summary of Mathematical Formulas
- **Ferromagnetic Resonance Condition**:
\[
\Delta E_Z = g\mu_B B_{\text{eff}}=\hbar\omega
\]
where \(g\) is the Landé g - factor, \(\mu_B\) is the Bohr magneton, \(B_{\text{eff}}\) is the effective magnetic field, and \(\omega\) is the frequency of the applied alternating magnetic field.

- **Lorentz Fitting Formula**:
\[
\tilde{\chi}(f)=\frac{2P}{\pi\Delta f}\cdot\frac{1}{4(f - f_{\text{res}})^2+\Delta f^2}
\]
where \(P\) is the peak amplitude, \(f\) is the frequency of the applied alternating magnetic field, and \(\Delta f\) is the full width at half maximum.

- **Herring - Kittel Formula**:
\[
f_{\text{res}}=\frac{\gamma}{2\pi}\left[(H_{\text{DC}}+\frac{2Aq^2}{M_s})(H_{\text{DC}}+\frac{2Aq^2}{M_s}+4\pi M_s F_{n,p})\right]^{1/2}
\]
where \(q\) is the wave vector, \(A\) is the exchange stiffness, \(M_s\) is the saturation magnetization, and \(F_{n,p}\) contains non - trivial demagnetizing field information.

- **Exchange Energy**:
\[
E_A=\frac{A}{M_s^2}\int(\nabla