Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technology, which can bypass the limitation of optical-spatial-bandwidth product to achieve imaging with both high resolution and wide field-of-view. Original FPM setup is limited to image thin samples with angle-varied illuminations. A diffuser scanning FPM method, which scans a diffuser with unknown profile between the object and objective lens to modulate the complex exit wavefront of the object, is implemented to address this 3D refocusing problem. However, since the profile of the diffuser is unknown, the number of images required for method to converge is large. A mechanical translation stage is also required, which may introduce the systematic error of the position. In this paper, we propose a new FPM method with wavefront modulation imposed by spatial light modulator (SLM). The SLM is placed between the object and the objective lens to produce specific pattern profile, which is used to modulate the complex exit wavefront of the object. Fourier ptychographic phase retrieval process is employed to recovery the complex exit wavefront of the object. With the use of SLM, it is unnecessary to employ 2D motorized translation stage to move the imposed pattern profile so that the error of translation stage is eliminated. Moreover, since the imposed pattern profile is known, the number of images required for the algorithm to converge is reduced. Simulation and experiment are performed to validate the effectiveness of our proposed method. Compared with the method, which utilizes unknown diffuser, our method can achieve a more accurate reconstruction result with a faster data acquisition and higher convergence speed.

Moment analysis of focus-diverse point spread functions for modal wavefront sensing of uniformly illuminated circular-pupil systems

Fast Wavefront Sensing Method Based on Diffraction Basis Vectors for Tightly Focused Optical Systems

Wavefront Modulation with Spatial Light Modulator for Fourier Ptychographic Microscopy

Property of Wave-Front Coding Imaging Systems for Extending the Depth of Field

Analysis of optical systems with extended depth of field using the Wigner distribution function.

Modal-based Nonlinear Optimization Algorithm for Wavefront Measurement with Under-Sampled Data.

Wavefront Analysis Method of Pinhole Point-Diffraction Based on Waveguide Theory

Modal-based Adaptive Autofocusing Phase Retrieval for Wavefront Measurement

Point Spread Function Engineering Based on Wavefront Phase Modulation

Realization Method of Full-Field Point Spread Function

Multiplexed wavefront sensing with a thin diffuser

Point Spread Function Characteristics Analysis of the Wavefront Coding System.

Point Spread Function Analysis of a Cubic Phase Wavefront Coding System with a Circular Pupil

High Sensitivity Wavefront Sensing with a non-linear Curvature Wavefront Sensor

Lensless broadband diffractive imaging with improved depth of focus: wavefront modulation by multilevel phase masks

Simple PSF Based Method for Pupil Phase Mask’s Optimization in Wavefront Coding System

High Speed Focal Plane Wavefront Sensing with an Optical Chopper

Differential OTF Wavefront Sensing

Nonlinear techniques for few-mode wavefront sensors

Principle and application of holographic modal wavefront sensor for extended objects and general aberration modes

Full-field Fourier Ptychography (FFP): Spatially Varying Pupil Modeling and Its Application for Rapid Field-Dependent Aberration Metrology