Polarization fluctuation dominated electrical transport processes of polymer based ferroelectric-field-effect transistors

Satyaprasad P. Senanayak,S. Guha,K. S. Narayan
DOI: https://doi.org/10.1103/PhysRevB.85.115311
2012-02-20
Abstract:Ferroelectric field-effect transistors (FE-FETs) consisting of tunable dielectric layers are utilized to investigate interfacial transport processes. Large changes in the dielectric constant as a function of temperature are observed in FE-FETs in conjunction with the ferroelectric to paraelectric transition. The devices offer a test bed to evaluate specific effects of polarization on the electrical processes. FE-FETs have dominant contributions from polarization-fluctuation rather than static dipolar disorder prevalent in high k paraelectric dielectric-based FETs. Additionally, photo-excitation measurements in the depletion mode reveal clear features in the FET response at different temperatures, indicative of different transport regimes.
Materials Science
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