X-ray Photoelectron Spectroscopy Analysis of Nafion-Containing Samples: Pitfalls, Protocols, and Perceptions of Physicochemical Properties

Michael J. Dzara,Kateryna Artyushkova,Jayson Foster,Hamideh Eskandari,Yechuan Chen,Scott A. Mauger,Plamen Atanassov,Kunal Karan,Svitlana Pylypenko
DOI: https://doi.org/10.1021/acs.jpcc.4c00872
2024-05-30
The Journal of Physical Chemistry C
Abstract:X-ray photoelectron spectroscopy (XPS) is one of the most common techniques used to analyze the surface composition of catalysts and support materials used in polymer electrolyte membrane (PEM) fuel cells and electrolyzers, providing important insights for further improvement of their properties. Characterization of catalyst layers (CLs) is more challenging, which can be at least partially attributed to the instability of ionomer materials such as Nafion during measurements. This work explores...
chemistry, physical,nanoscience & nanotechnology,materials science, multidisciplinary
What problem does this paper attempt to address?
The main problem that this paper attempts to solve is the stability and degradation issues encountered when using X - ray photoelectron spectroscopy (XPS) technology to analyze samples containing Nafion materials. Specifically, Nafion, as a commonly used ion - exchange polymer, is widely used in the catalyst layers (CLs) of proton - exchange membrane fuel cells (PEMFCs) and electrolyzers. However, during XPS measurement, Nafion is easily affected by X - ray radiation and undergoes degradation, which may lead to data distortion and affect the accurate analysis of the chemical state of the material surface. ### Research Background and Motivation 1. **Importance of Nafion**: - Nafion is an important ion - exchange polymer, often used in proton - exchange membrane fuel cells (PEMFCs) and electrolyzers. - In these applications, Nafion usually exists in the catalyst layer (CLs), interacting with the catalyst and support materials and affecting battery performance. 2. **Application of XPS Technology**: - XPS is a commonly used technology for analyzing the surface composition of catalysts and support materials, providing important information about material properties. - However, Nafion is prone to degradation during XPS measurement, resulting in data distortion and affecting the reliability of research results. 3. **Deficiencies in Existing Research**: - Early research has shown that Nafion degrades during XPS measurement, but the results among different studies are inconsistent, possibly due to differences in instruments, X - ray exposure time, Nafion film thickness, etc. - A reliable method is needed to evaluate and minimize Nafion degradation during XPS measurement to ensure data accuracy. ### Research Objectives 1. **Evaluate the Stability of Nafion**: - Study the stability of Nafion under different XPS instruments and measurement conditions, especially the degree of Nafion degradation during X - ray exposure. - Develop a method that can minimize Nafion degradation through a multi - point XPS data acquisition protocol to ensure data reliability. 2. **Optimize XPS Measurement Methods**: - Develop and validate a multi - point XPS data acquisition protocol. By performing short - time scans at multiple positions, reduce the X - ray exposure time at a single position, thereby minimizing Nafion degradation. - Apply this protocol to analyze Nafion films and Nafion - containing catalyst layers to obtain reliable data. 3. **Explore the Surface Properties of Nafion**: - Use the optimized XPS measurement method to study the surface chemical state of Nafion films and Nafion - containing catalyst layers, and explore the interaction at the catalyst - ion - exchange polymer interface and its impact on PEMFC performance. ### Main Contributions 1. **Systematically Evaluated the Stability of Nafion during XPS Measurement**: - Through experiments on different XPS instruments, the degradation mechanism of Nafion during X - ray exposure was revealed. - It was found that the degree of Nafion degradation is affected by factors such as X - ray exposure time and intensity, and Nafion film thickness. 2. **Developed a Multi - point XPS Data Acquisition Protocol**: - This protocol effectively reduces the X - ray exposure time at a single position by performing short - time scans at multiple positions, significantly reducing Nafion degradation. - The application of this protocol enables the acquisition of reliable Nafion surface chemical data during XPS measurement. 3. **Provided a Reliable Method for Analyzing Nafion Surface Properties**: - Through the analysis of Nafion films and Nafion - containing catalyst layers, the surface chemical changes of Nafion under different conditions were revealed, providing a basis for in - depth study of the interaction at the catalyst - ion - exchange polymer interface. In summary, this paper solves the problem of Nafion's easy degradation during XPS measurement by systematically evaluating the stability of Nafion during XPS measurement and developing a multi - point XPS data acquisition protocol, providing a reliable analysis method for the research of PEMFCs and electrolyzers.