Abstract:We use dynamic nuclear polarization (DNP) enhanced nuclear magnetic resonance (NMR) at liquid helium temperatures to directly detect hydrogen attached to the surface of silicon microparticles. The proton NMR spectrum from a dry sample of polycrystalline silicon powder (1-5 $\mu$m) shows a distinctively narrow Lorentzian-shaped resonance with a width of 6.2 kHz, indicative of a very sparse distribution of protons attached to the silicon surface. These protons are within a few atomic monolayers of the silicon surface. The high sensitivity NMR detection of surface protons from low surface area ($0.26 - 1.3 \: m^2/g$) particles is enabled by an overall signal enhancement of 4150 over the room temperature NMR signal at the same field. When the particles were suspended in a solvent with 80% H2O and 20% D2O, the narrow peak was observed to grow in intensity over time, indicating growth of the sparse surface proton layer. However, when the particles were suspended in a solvent with 20% H2O and 80% D2O, the narrow bound-proton peak was observed to shrink due to exchange between the surface protons and the deuterium in solution. This decrease was accompanied by a concomitant growth in the intensity of the frozen solvent peak, as the relative proton concentration of the solvent increased. When the particles were suspended in the organic solvent hexane, the proton NMR spectra remained unchanged over time. These results are consistent with the known chemisorption of water on the silicon surface resulting in the formation of hydride and hydroxyl species. Low-temperature DNP NMR can thus be used as a non-destructive probe of surface corrosion for silicon in aqueous environments. This is important in the context of using silicon MEMS and bioMEMS devices in such environments, for silicon micro- and nano-particle MRI imaging agents, and the use of nanosilicon for splitting water in fuel cells.

Nano-Raman spectroscopy of silicon surfaces

Micromechanical Measurement of Active Sites on Silicon Nitride Using Surface Free Energy Variation

In Situ Monitoring of Raman Scattering and Photoluminescence from Silicon Surfaces in Hf Aqueous Solutions

Enhanced-Raman scattering from silicon nanoparticle substrates

Surface Bonding on Silicon Surfaces As Probed by Tip-Enhanced Raman Spectroscopy

In situ Raman scattering from silicon surfaces - Effects of solution pH

Surface Ramam Spectrpscopy for in Situ Investigating Silicon Etching Process

Chemical analysis of ligand-free silicon nanocrystal surfaces by surface enhanced Raman spectroscopy

Resonant Optical Properties of Crystalline Silicon Nanoparticles Fabricated by Laser Ablation-Based Methods

Sub-Micron Imaging Of Sub-Surface Nanocrystalline Structure In Silicon

Near-field Raman Spectral Measurement of Monocrystalline Silicon by Apertureless SNOM in Feflection Geometry

Nanoantennas for Surface Enhanced Infrared Spectroscopy: Effects of Interaction and Higher Order Resonant Excitations

Silicon Nanoparticles As Raman Scattering Enhancers

Surface-enhanced Raman spectroscopy as a tool for characterizing nanostructures containing molecular components

Hybrid Nanostructure of SiO2@Si with Au-nanoparticles for Surface Enhanced Raman Spectroscopy.

Chemisorption of water on the surface of silicon microparticles measured by DNP-enhanced NMR

Silicon Nanohybrid-Based Surface-Enhanced Raman Scattering Sensors.

Enhancement Of Raman Scattering Using Silica Microparticles

Laser Photochemical Nanostructuring of Silicon for Surface Enhanced Raman Spectroscopy

Enhanced Raman Scattering of Silicon Nanowires by Ag Nanoparticles in‐situ Decoration

Si nano-cavity enabled surface-enhanced Raman scattering signal amplification