X-Ray Diffraction Studies of l-Isoleucine Under Shocked Conditions
S. Sahaya Jude Dhas,A. Sivakumar,Lidong Dai,Raju Suresh Kumar,Abdulrahman I. Almansour,S. A. Martin Britto Dhas
DOI: https://doi.org/10.1007/s11664-023-10873-1
IF: 2.1
2023-12-31
Journal of Electronic Materials
Abstract:One of the most important industrial requirements is to find the materials which have the tendency to withstand harsh environments, such as high pressure, high temperature, and radiation environments, so that they will maintain high efficiency in these conditions. Such materials are greatly required for aerospace, defense, and high-temperature molecular device fabrications. In the present context, we have chosen l-isoleucine samples to assess the crystallographic phase stability under dynamic shocked conditions. The stability result has been screened by a powder x-ray diffractometer (PXRD). Based on the observed diffraction results, it is well evidenced by the cleavage planes, such as (002) (003), (004), (005), and (006), that the applied shock waves do not induce any crystallographic phase transitions and lattice deformations even at 200 shocks. The unit cell dimensions of the l-isoleucine sample were a = 9.752 Å, b = 5.321 Å, c = 14.13 Å and V = 728 Å3 which were found to be the same under all numbers of shocked conditions. Hence, the l-isoleucine sample is strongly suggested for device fabrication, and previous static high-pressure experimental results also support this suggestion.
engineering, electrical & electronic,materials science, multidisciplinary,physics, applied