Signature of Martensite transformation on conductivity noise in thin films of NiTi shape memory alloys

Chandni. U,Arindam Ghosh,H. S. Vijaya,S. Mohan
DOI: https://doi.org/10.1063/1.2896304
2008-11-02
Abstract:Slow time-dependent fluctuations, or noise, in the electrical resistance of dc magnetron sputtered thin films of Nickel Titanium shape memory alloys have been measured. Even in equilibrium, the noise was several orders of magnitude larger than that of simple diffusive metallic films, and was found to be non-monotonic around the martensitic transformation regime. The results are discussed in terms of dynamics of structural defects, which also lay foundation to a new noise-based characterization scheme of martensite transformation.
Other Condensed Matter,Strongly Correlated Electrons
What problem does this paper attempt to address?