Nanomachining of mesoscopic graphite

P. Barthold,T. Luedtke,R. J. Haug
DOI: https://doi.org/10.48550/arXiv.0803.2470
2008-03-18
Abstract:An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining narrow trenches. We found a reversible behavior in the electrical resistance which we attribute to the movement of dislocations. After several attempts also permanent changes are observed.
Mesoscale and Nanoscale Physics
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