Nanoscale Observation of Alkane Delayering

M. Bai,K. Knorr,M. J. Simpson,S. Trogisch,H. Taub,S. N. Ehrlich,H. Mo,U. G. Volkmann,F. Y. Hansen
DOI: https://doi.org/10.48550/arXiv.cond-mat/0611497
2006-11-19
Abstract:Noncontact Atomic Force Microscopy and synchrotron x-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point Tb in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above Tb and to a solid 3D phase on cooling below Tb. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.
Soft Condensed Matter
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