Electron ptychographic microscopy for three-dimensional imaging

Si Gao, Peng Wang, Fucai Zhang, Gerardo T Martinez, Peter D Nellist, Xiaoqing Pan, Angus I Kirkland
2017-07-31
Abstract:Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24–30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.
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