What problem does this paper attempt to address?

The problems that this paper attempts to solve are: understanding the injection and transport characteristics of electrons and holes in a single pentacene monolayer island, especially the charge distribution and migration behavior under different molecular arrangement orderliness (ordered vs. disordered) conditions. Specifically, the researchers focus on the following points: 1. **Charge injection and transport mechanisms**: By locally injecting electrons and holes, study the distribution of these carriers in the pentacene monolayer and whether they can be delocalized throughout the island. This helps to reveal the electronic properties of organic materials at the nanoscale. 2. **Analysis of influencing factors**: Explore the influence of the orderliness of molecular arrangement on the charge transport performance. It is found that in the crystalline monolayer island, the injected carriers can move freely throughout the island; while in the disordered monolayer, the carriers remain near their injection points and cannot diffuse effectively. 3. **Application prospects**: These results are crucial for understanding the working principles of organic transistors and other molecular devices, especially in their initial growth stages. Through in - depth understanding of these characteristics, the design and performance of organic electronic devices can be optimized. 4. **Quantitative measurement methods**: A technique combining atomic force microscopy (AFM) and electrostatic force microscopy (EFM) has been developed to accurately measure the charge distribution and concentration within a single pentacene monolayer island. This method can not only observe the delocalized or localized behavior of charges, but also quantitatively determine the amount of injected charges and their distribution maps. Through the above research, the authors hope to provide new insights into the relationship between the microstructure of organic semiconductor materials and their electrical properties, and provide theoretical support for the design of future organic electronic devices. ### Formula summary The formulas involved in the paper are mainly used to describe the relationship between the phase shift of electrostatic force microscopy (EFM) and the capacitive gradient force and the charge gradient force. The specific formulas are as follows: - **Phase shift caused by capacitive gradient force**: \[ \Delta \Phi_C = -\frac{3}{2} \frac{\epsilon_0 S}{k h (z + h)} V_{\text{EFM}}^2 \] where \(\epsilon_0\) is the vacuum permittivity, \(S\) is the capacitance area between the tip and the substrate, \(h\) is the height of the island, \(z\) is the distance between the tip and the substrate, \(V_{\text{EFM}}\) is the EFM bias voltage, and \(k\) is the spring constant of the cantilever. - **Phase shift caused by charge gradient force**: \[ \Delta \Phi_Q = -\frac{3}{2} \frac{\epsilon_R Q}{k h (z + h)} V_{\text{EFM}} \] where \(\epsilon_R\) is the relative permittivity of pentacene and \(Q\) is the amount of charge stored in the island. - **Surface charge density calculation**: \[ \sigma = \frac{\alpha \epsilon_0}{e} \left( \frac{\Delta \Phi_Q}{\Delta \Phi_C} - V_{\text{EFM}} \right) \] where \(\alpha\) is the tip shape factor and \(e\) is the electron charge. These formulas help researchers extract key information about charge distribution from experimental data.

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