Atomic Scattering Factor for a Spherical Wave and the Near Field Effects in X-ray Fluorescence Holography

Jianming Bai
DOI: https://doi.org/10.1103/PhysRevB.68.144109
2003-05-14
Abstract:Formula for calculating the atomic scattering factor for spherical x-ray waves is derived and used to solve the near field effects problem in X-ray Fluorescence Holography theory. A rigorous formalism to calculate the X-ray fluorescence hologram for given atomic distributions is then given so that quantitative structural information can be derived from XFH measurements.
Materials Science,Strongly Correlated Electrons
What problem does this paper attempt to address?
The paper aims to address the issue of near-field effects in X-ray Fluorescence Holography (XFH). Specifically, the paper focuses on the following two aspects: 1. **Calculation of Atomic Scattering Factor (ASF)**: - Traditionally, ASF is calculated under the assumption that the X-ray source and detector are far from the scatterer, using plane waves to represent the incident and scattered X-rays. This assumption is valid in most X-ray scattering experiments, but in XFH, due to the close distance between the source and the scatterer, this assumption is no longer applicable. - The paper derives formulas for calculating the atomic scattering factor for spherical waves and studies its dependence on the scatterer atomic radius, the source-scatterer or scatterer-detector distance, and the wavelength. 2. **Handling of Near-Field Effects**: - In XFH, due to the close distance between the source and the scatterer, the vector nature of the electromagnetic field leads to near-field effects. These effects need to be considered in theoretical calculations to obtain more accurate structural information. - The paper considers not only the near-field effects caused by the spherical wavefront but also those caused by the vector nature of the electromagnetic field, providing rigorous expressions that include these effects. By addressing these issues, the paper provides a theoretical foundation for extracting quantitative structural information from XFH measurements, thereby promoting the development and application of XFH technology.