A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films

A. Fessant,J. Gieraltowski,C. Tannous,R. Valenzuela
DOI: https://doi.org/10.1016/j.jmmm.2003.12.1372
2003-05-12
Abstract:A novel broad-band measurement method of the MI in thin films and ribbons is presented. It is based on the automated measurement of the reflection coefficient of a cell loaded with the sample. Illustrative results obtained with a permalloy multilayer thin film are presented and discussed.
Materials Science
What problem does this paper attempt to address?