Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure During Lithiation Using Off-axis Electron Holography
Z. Gan,M. Gu,J. Tang,C. Y. Wang,K. L. Wang,C. M. Wang,D. J. Smith,M. R. McCartney
DOI: https://doi.org/10.1017/s143192761500776x
IF: 4.0991
2015-01-01
Microscopy and Microanalysis
Abstract:Journal Article Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography Get access Z Gan, Z Gan Department of Physics, Arizona State University, Tempe, AZ 85287 Search for other works by this author on: Oxford Academic Google Scholar M Gu, M Gu Environmental Molecular Sciences Lab, Pacific Northwest National Laboratory, Richland, WA 99352 Search for other works by this author on: Oxford Academic Google Scholar J Tang, J Tang Device Research Lab., Dept. Electrical Engineering, University California, Los Angeles, CA 90095 Search for other works by this author on: Oxford Academic Google Scholar C Y Wang, C Y Wang Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei City, Taiwan, 10607, Republic of China Search for other works by this author on: Oxford Academic Google Scholar K L Wang, K L Wang Device Research Lab., Dept. Electrical Engineering, University California, Los Angeles, CA 90095 Search for other works by this author on: Oxford Academic Google Scholar C M Wang, C M Wang Environmental Molecular Sciences Lab, Pacific Northwest National Laboratory, Richland, WA 99352 Search for other works by this author on: Oxford Academic Google Scholar D J Smith, D J Smith Department of Physics, Arizona State University, Tempe, AZ 85287 Search for other works by this author on: Oxford Academic Google Scholar M R McCartney M R McCartney Department of Physics, Arizona State University, Tempe, AZ 85287 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1397–1398, https://doi.org/10.1017/S143192761500776X Published: 23 September 2015