Coupled effects of electronic and nuclear energy deposition in UO 2 crystals: A high-resolution XRD study carried out at the MARS beamline of the SOLEIL synchrotron facility

Gaëlle Gutierrez,Alexandre Boulle,Denis Menut,Arthur Georgesco,Claire Onofri,Jean-Luc Béchade,Aurélien Debelle
DOI: https://doi.org/10.1016/j.nimb.2024.165491
2024-09-13
Abstract:For the first time at the SOLEIL synchrotron facility's MARS beamline, UO 2 single-crystal-like samples underwent characterization, and strain depth profiles were established. Single crystals oriented along (1 1 0) and (1 1 1) were submitted to ion irradiation in the nuclear energy-loss regime (S n ) using 900 keV I 2+ ions, and also with concomitant electronic energy deposition (S e ) using 27 MeV Fe 9+ ions. X-ray diffraction measurements were conducted at the MARS beamline, specialized for radioactive material analysis. High-angular-resolution reciprocal space maps around asymmetrical reflections and conventional symmetrical θ/2θ scans were recorded. Analysis with the RaDMaX software allowed retrieving the strain depth profiles. Results reveal that the S n -irradiated surface layer exhibits tensile strain along its normal with no in-plane strain, that this normal strain is partially relaxed by S e . Both crystal orientations display similar behavior, but not with the same magnitude. Comparison with polycrystals indicates a more pronounced strain relaxation in the latter case.
physics, nuclear, atomic, molecular & chemical,nuclear science & technology,instruments & instrumentation
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