Off-axis differential interference contrast (DIC) microscopy enabled by polarization gratings pair and synthetic aperture technology for integrational and sectional quantitative phase imaging

Yi Wang,Liyun Zhong,Xinyue Xing,Xiaoxu Lu,Qiujia Chen,Qiao Tao,Yuwen Qin
DOI: https://doi.org/10.1016/j.optlaseng.2022.107441
IF: 5.666
2022-12-25
Optics and Lasers in Engineering
Abstract:Differential interference contrast (DIC) microscopy is an important member of quantitative phase imaging (QPI) family owing to its simple optical implementation and high compatibility regarding to different coherence degree of illumination field. Such compactivity means that the DIC-based phase imaging can be conveniently converted between 2D-integrational and 3D-sectional modes by switching the spatial coherence degree of illumination field between low degree and high. However, there is a potential trade-off compromise in the existed experimental implementations for DIC imaging regarding to the optical simplicity, space-bandwidth utilization and temporal resolution. In this manuscript, we proposed a polarization gratings pair (PGs) based off-axis DIC system to realize integrational and sectional QPI. Building on a bright field microscope and getting rid of the additional 4f lens system, the proposed PGs-DIC system can realize single-shot QPI with an ultra-compact optical configuration. In order to improve the imaging resolution and optical sectional ability, a fast synthetic aperture technology is introduced, in which multiple interferograms with different line-filtered illumination are captured. Both high resolution 2D-integrational and 3D-sectional phase imaging results indicate that the proposed PGs-DIC system is a good candidate for QPI. Specially, a theoretical model is proposed to quantitatively estimate z-direction resolution for z -scanning 3D phase imaging technology and future application in the PGs-DIC system.
optics
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