Insulation Degradation Characteristics and Phase-Field Simulation of Epoxy Resin for Valve-Side Bushing Under Strongly Coupled Electrothermal Field
Gaoyi Shang,Xuandong Liu,Yuhang Shao,Ming Chen,Yingman Sun,Qiaogen Zhang,Hao Tang,Xining Li
DOI: https://doi.org/10.1109/tdei.2024.3375804
IF: 2.509
2024-04-03
IEEE Transactions on Dielectrics and Electrical Insulation
Abstract:As voltage levels increase, insulation materials often suffer insulation failures in recent years, such as epoxy resin (ER) for valve-side bushings. Under the combined effect of a strongly coupled electrothermal field, the bushing radial insulation breakdown accident happens from time to time. In this article, an electrothermal treeing experimental setup was built. The treeing characteristics of ER from 40 °C to 120 °C were tested. A novel treeing model under a strongly coupled electrothermal field was proposed. The treeing process based on the physical parameters was simulated by using COMSOL Multiphysics. The results show that the critical energy density of partial damage in the phase field model is determined to be J/m2. The experiment and simulation results consistently show that with the increase in the ER temperature, the morphology of the trees changes from branch type to mixed bush-branch type, the fractal dimension of the trees increases, and the breakdown time delay of the specimens is shortened, which is caused by the increase in dielectric constant, the dielectric loss angle tangent value, and the phase diffusion coefficient. In addition, the simulation results show that the electrostatic energy distribution of the specimens has a significant effect on the treeing process, and the higher the electrostatic energy is, the faster trees develop. The results of this article may help to understand the initiation and growth of electrical trees and to optimize insulation materials from an energetic point of view.
engineering, electrical & electronic,physics, applied