Abstract:In industries spanning manufacturing to software development, defect segmentation is essential for maintaining high standards of product quality and reliability. However, traditional segmentation methods often struggle to accurately identify defects due to challenges like noise interference, occlusion, and feature overlap. To solve these problems, we propose a cross-hierarchy feature fusion network based on a composite dual-channel encoder for surface defect segmentation, called CFF-Net. Specifically, in the encoder of CFF-Net, we design a composite dual-channel module (CDCM), which combines standard convolution with dilated convolution and adopts a dual-path parallel structure to enhance the model's capability in feature extraction. Then, a dilated residual pyramid module (DRPM) is integrated at the junction of the encoder and decoder, which utilizes the expansion convolution of different expansion rates to effectively capture multi-scale context information. In the final output phase, we introduce a cross-hierarchy feature fusion strategy (CFFS) that combines outputs from different layers or stages, thereby improving the robustness and generalization of the network. Finally, we conducted comparative experiments to evaluate CFF-Net against several mainstream segmentation networks across three distinct datasets: a publicly available Crack500 dataset, a self-built Bearing dataset, and another publicly available SD-saliency-900 dataset. The results demonstrated that CFF-Net consistently outperformed competing methods in segmentation tasks. Specifically, in the Crack500 dataset, CFF-Net achieved notable performance metrics, including an Mcc of 73.36%, Dice coefficient of 74.34%, and Jaccard index of 59.53%. For the Bearing dataset, it recorded an Mcc of 76.97%, Dice coefficient of 77.04%, and Jaccard index of 63.28%. Similarly, in the SD-saliency-900 dataset, CFF-Net achieved an Mcc of 84.08%, Dice coefficient of 85.82%, and Jaccard index of 75.67%. These results underscore CFF-Net's effectiveness and reliability in handling diverse segmentation challenges across different datasets.

NFCF: Industrial Surface Anomaly Detection with Normalizing Flow Cross-Fitting Network

A Multi-scale Normalizing Flow Network for Surface Defects Detection

A Wafer Surface Defect Detection Method Built on Generic Object Detection Network

Fully Convolutional Cross-Scale-Flows for Image-based Defect Detection

An Effective Industrial Defect Classification Method under the Few-Shot Setting Via Two-Stream Training

Fully Convolutional Networks for Surface Defect Inspection in Industrial Environment

A Sub-Region Unet for Weak Defects Segmentation with Global Information and Mask-Aware Loss.

AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection

A Deep Learning-Based Surface Defect Inspection System Using Multiscale and Channel-Compressed Features

Cross-Attention Regression Flow for Defect Detection

Efficient Conflict-Filtered Network for Defect Detection

CFF-Net: Cross-Hierarchy Feature Fusion Network Based on Composite Dual-Channel Encoder for Surface Defect Segmentation

An Adaptive Image Segmentation Network for Surface Defect Detection

Computer Vision and Normalizing Flow-Based Defect Detection

AFFNet: An Attention-Based Feature-Fused Network for Surface Defect Segmentation

Center-based Transfer Feature Learning With Classifier Adaptation for surface defect recognition

An Efficient Network for Surface Defect Detection

A High-Efficiency Fully Convolutional Networks for Pixel-Wise Surface Defect Detection

A Global-Local Feature Multilevel Fusion Network for Chip Defect Segmentation

A nondestructive automatic defect detection method with pixelwise segmentation

Unsupervised Defect Segmentation Via Forgetting-Inputting-Based Feature Fusion and Multiple Hierarchical Feature Difference