Abstract:An embedded system implementing fringe encoding, image acquisition and algorithm processing has been recently designed and developed for 3D shape measurement based on structured light technology. Compared with traditional 3D shape measurement system, which has disadvantages of complex structure and slow processing speed, our embedded system is more effective in industrial quality detection. With self-developed digital micro projector based on liquid crystal on silicon, the structured light patterns are projected by high-resolution such as 720p. In the generated module of the stripes, we add a Gamma value to lower the projection error. Image acquisition sensor is synchronized with the micro projector by EP2C8 FPGA hardware circuits, which simultaneously control the phase encoding fringes according to different characteristic objects. To get high performance, accurate synchronization is crucial, especially in Phase Shifting Method, there are sequential images with shifting phases, in other words hardware circuit guarantee the processing speed before algorithm processing. We improved the three step phase algorithm, using the intensity modulation, which is a relatively simple method to solve the intensity imbalance of the three images. By implementing the digital signal processing (DSP) TMS320DM642 system, we realized three-dimensional measurement with a pipeline process of structure light encoding, image acquisition and three-dimensional reconstruction. Finally the measure experiment shows that the processing frame rate is up to 16 fps, and the measurement error is less than three percent. It means we can quickly and accurately detect three-dimensional profile with the portable device.

Three-dimensional measurement based on equal spacing binary fringe coding

Optimization of binary structured light coding for fast 3D shape measurement

3D Measurement System Based on Computer-Generated Gratings

Threshold-optimized Dithering Technique for High-quality 3D Shape Measurement

3D Object Reconstruction Algorithm Based on Dynamic Threshold Dithering Technique

High-Quality Three-Dimensional Shape Measurement Based on Binary Particle Swarm Dithering Optimization

High-Quality 3d Shape Measurement By Kernel-Optimized High Sinusoidal Similarity Dither Patterns

A depth measurement method using two structured light binary patterns

Embedded Three-Dimensional Shape Measurement System with Microprojector

Phase Error Correction by &Lt;inline-Formula><math Display="inline" Overflow="scroll"><mi>π</mi></math></inline-Formula>-shift Odd-Step Fringe Projection and Speckle Filtering in Phase Measuring Profilometry

High-accuracy Three-dimensional Measurement by Improving the Asymmetry of Dithered Patterns

Spatial–Temporal Binarization Method via Jointly Optimizing Diffusion Kernel and Quantization Threshold for 3-D Surface Imaging

3D shape measurement based on color-encoded sinusoidal fringe Projection

Improved Dual-Frequency On-Line Phase Measuring Profilometry Based On Full-Cycle Equal Phase-Shift Algorithm

High-accuracy 3D measurement technique without phase unwrapping based on fringe projection

Phase Demodulation Method for Fringe Projection Measurement Based on Improved Variable-Frequency Coded Patterns

A New Color Structured Light Coding Method for Three-Dimensional Measurement of Isolated Objects

Three-dimensional shape measurement based on color complementary phase coding method

Development of a Fast Binocular Structured Light Measuring System Using Composite Fringe Projection

On-line Three-Dimensional Inspection Using Randomly Phase-Shifting Fringe Based on Least-Square Iteration

Two-Digit Phase-Coding Strategy for Fringe Projection Profilometry