Direct characterization of shear phonons in layered materials by mechano-Raman spectroscopy

Susu Fang,Sai Duan,Xingzhi Wang,Sijie Chen,Li Li,Hua Li,Baichuan Jiang,Chuanhui Liu,Nanyang Wang,Lei Zhang,Xinglin Wen,Yagang Yao,Jun Zhang,Daiqian Xie,Yi Luo,Weigao Xu
DOI: https://doi.org/10.1038/s41566-023-01181-5
IF: 35
2023-03-31
Nature Photonics
Abstract:Shear phonons are collective atomic-layer motions in layered materials that carry critical information about mechanical, thermal and optoelectronic properties. Phonon branches with co-directional atomic-layer motions carry unique information about the global structure and hidden interfaces in layered crystals and heterostructures, but they are not detectable due to the very limited electron–phonon coupling. Here we utilize the propagating feature and mechanical coupling between shear phonons and localized plasmonic cavities to successfully realize direct characterization of ground-state shear phonons down to 4 cm −1 in energy by introducing mechano-Raman spectroscopy (MRS). MRS has the ability to characterize the global crystal structure with more than 10 8 -fold enhancement and to accurately measure subpicometre displacements under ambient conditions with a thermal-noise-free feature. The propagating behaviour and the capacity of MRS to detect optically hidden interfaces are demonstrated. The broad tunability of plasmons makes the MRS technique a robust tool for extensive applications, including global crystal flaw detection, mechanical sensing and the mechanical modulation of light.
optics,physics, applied
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