Few-fringe-based phase-shifting profilometry employing hilbert transform
Peng Xu,Jintao Liu,Wen Zhang,Shuo Shan,Jianhua Wang,Mingwei Shao,Zhaopeng Deng
DOI: https://doi.org/10.1016/j.precisioneng.2023.05.006
IF: 3.315
2023-09-01
Precision Engineering
Abstract:In optical measurement techniques, when the projector works at a constant projection rate, reducing the number of projected fringe patterns is an effective way to reduce the projection time. In this paper, we propose a few-fringe-based phase-shifting profilometry employing Hilbert transform. We project only two fringe patterns for each frequency of fringes, with the phase shift between the fringes designed to be π. The Hilbert transform makes these two captured fringes phase shifted by π/2, thus transforming the original two fringes into four, and the wrapped phase can be obtained through these four fringes with a phase difference of π/2. To improve the accuracy and robustness of the method, we adopt three frequencies of fringes for phase unwrapping. Further, since different phase unwrapping methods can be used for the different frequencies of the fringes, we propose a heterodyne 2H+2 M+2 L method and a hierarchical 2H+2 M+2 L respectively. Multiple experimental results have confirmed the feasibility and effectiveness of the two 2H+2 M+2 L methods, and the different characteristics of the reconstructed shapes obtained by the two 2H+2 M+2 L methods are compared to provide useful guidance in the selection of the required method for different application scenarios. The experimental results demonstrate that when using the heterodyne and hierarchical methods for phase unwrapping, the RMSE of the 2H+2 M+2 L method is only higher than that of the three-frequency four-step phase-shifting method by 0.0056 and 0.0024 respectively, but this 2H+2 M+2 L method improves the efficiency of the three-frequency four-step phase-shifting method by 50%.
engineering, manufacturing,nanoscience & nanotechnology, multidisciplinary,instruments & instrumentation