Improving the Signal-to-Noise Ratio of Axial Displacement Measurements of Microspheres Based on Compound Digital Holography Microscopy Combined with the Reconstruction Centering Method

Yanan Zeng,Qihang Guo,Xiaodong Hu,Junsheng Lu,Xiaopan Fan,Haiyun Wu,Xiao Xu,Jun Xie,Rui Ma
DOI: https://doi.org/10.3390/s24092723
IF: 3.9
2024-04-25
Sensors
Abstract:In 3D microsphere tracking, unlike in-plane motion that can be measured directly by a microscope, axial displacements are resolved by optical interference or a diffraction model. As a result, the axial results are affected by the environmental noise. The immunity to environmental noise increases with measurement accuracy and the signal-to-noise ratio (SNR). In compound digital holography microscopy (CDHM)-based measurements, precise identification of the tracking marker is critical to ensuring measurement precision. The reconstruction centering method (RCM) was proposed to suppress the drawbacks caused by installation errors and, at the same time, improve the correct identification of the tracking marker. The reconstructed center is considered to be the center of the microsphere, rather than the center of imaging in conventional digital holographic microscopy. This method was verified by simulation of rays tracing through microspheres and axial moving experiments. The axial displacements of silica microspheres with diameters of 5 μm and 10 μm were tested by CDHM in combination with the RCM. As a result, the SNR of the proposed method was improved by around 30%. In addition, the method was successfully applied to axial displacement measurements of overlapped microspheres with a resolution of 2 nm.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to improve the signal - to - noise ratio (SNR) of axial displacement measurement in 3D micro - sphere tracking. Specifically, unlike planar motion which can be directly measured by a microscope, axial displacement needs to be analyzed through optical interference or diffraction models, and is thus susceptible to environmental noise. The paper proposes a technique based on the compound digital holographic microscope (CDHM) combined with the reconstruction centering method (RCM) to improve the accuracy and SNR of axial displacement measurement. ### Main problems 1. **Influence of environmental noise on axial displacement measurement**: In 3D micro - sphere tracking, the measurement of axial displacement is easily affected by environmental noise, resulting in a decrease in measurement accuracy. 2. **Influence of installation errors and aberrations**: Mechanical installation errors and coma aberration caused by beam expansion will affect the measurement results. 3. **Center positioning of overlapping micro - spheres**: Traditional methods are difficult to accurately position the centers of overlapping micro - spheres, especially in the case of overlapping diffraction patterns. ### Solutions 1. **Compound digital holographic microscope (CDHM)**: By using CDHM technology, the influence of double images can be reduced and the measurement accuracy can be improved by selecting an appropriate reconstruction distance. 2. **Reconstruction centering method (RCM)**: By accurately identifying the central position of the tracking mark instead of the traditional imaging center, the SNR and measurement accuracy are improved. 3. **Simulation and experimental verification**: The effectiveness of RCM is verified through ray - tracing simulation and actual micro - sphere movement experiments. ### Experimental results - **Improvement in SNR**: For defocused micro - spheres, the SNR is increased by approximately 30%; for near - focused micro - spheres, the SNR is increased by approximately 32.7%. - **Axial resolution**: The axial resolution of defocused micro - spheres reaches 2 nm, and the axial resolution of near - focused micro - spheres is 4 nm. - **Measurement of overlapping micro - spheres**: It is successfully applied to the axial displacement measurement of overlapping micro - spheres, with a resolution of 2 nm. Through these improvements, the paper provides an effective method to improve the accuracy and reliability of axial displacement measurement in 3D micro - sphere tracking.