CHARM High-energy Ions for Micro Electronics Reliability Assurance (CHIMERA)

Kacper Bilko,Rubén García Alía,Alessandra Costantino,Andrea Coronetti,Salvatore Danzeca,Marc Delrieux,Natalia Emriskova,Matthew Alexander Fraser,Sylvain Girard,Eliott Philippe Johnson,Marc Sebban,Federico Ravotti,Andreas Waets
DOI: https://doi.org/10.1109/tns.2024.3358376
IF: 1.703
2024-01-01
IEEE Transactions on Nuclear Science
Abstract:We present the progress related to CERN’s capacity of delivering highly penetrating, high-LET heavy ions for radiation effect testing of electronic components within the CHIMERA (CHARM High-energy Ions for Micro Electronics Reliability Assurance) project. Profiting from the existing accelerator infrastructure, Monte Carlo simulations and a 300 μm-thick silicon diode, we highlight the beam characterization capabilities and a summary of the beam properties. Finally, we present the comparison of the SRAM SEE cross-section measurements with respect to other heavy ion facilities.
engineering, electrical & electronic,nuclear science & technology
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