Charging of Vitreous Samples in Cryogenic Electron Microscopy Mitigated by Graphene

Yue Zhang,J. Paul van Schayck,Adrián Pedrazo-Tardajos,Nathalie Claes,Willem E. M. Noteborn,Peng-Han Lu,Hans Duimel,Rafal E. Dunin-Borkowski,Sara Bals,Peter J. Peters,Raimond B. G. Ravelli,Adrián Pedrazo-Tardajos
DOI: https://doi.org/10.1021/acsnano.3c03722
IF: 17.1
2023-08-04
ACS Nano
Abstract:Cryogenic electron microscopy can provide high-resolution reconstructions of macromolecules embedded in a thin layer of ice from which atomic models can be built de novo. However, the interaction between the ionizing electron beam and the sample results in beam-induced motion and image distortion, which limit the attainable resolutions. Sample charging is one contributing factor of beam-induced motions and image distortions, which is normally alleviated by including part of the supporting...
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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