Fast and Artifact-Free Excitation Multiplexing Using Synchronized Image Scanning

Ezra Bruggeman,Robin Van den Eynde,Baptiste Amouroux,Tom Venneman,Pieter Vanden Berghe,Marcel Müller,Wim Vandenberg,Peter Dedecker
DOI: https://doi.org/10.1021/acs.nanolett.4c00258
IF: 10.8
2024-09-03
Nano Letters
Abstract:Multicolor fluorescence microscopy is an essential tool to visualize structures and dynamics in the life and materials sciences. However, the near-simultaneous acquisition of labels differing in excitation spectrum is difficult and renders such measurements prone to artifacts. We present a simple strategy to provide quasi-simultaneous fluorescence imaging with multiple excitation wavelengths by using an optical element to displace the sample image on the sensor at a rate that is much faster than...
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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