Abstract:Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in laboratory XRD, TEM, and synchrotron X-ray sources. However, these techniques are slow, require careful sample preparation, can be difficult to access, and are prone to human error during analysis. This paper presents a newly developed methodology that represents a paradigm change in electron diffraction-based structure analysis techniques, with the potential to revolutionize multiple crystallography-related fields. A machine learning-based approach for rapid and autonomous identification of the crystal structure of metals and alloys, ceramics, and geological specimens, without any prior knowledge of the sample, is presented and demonstrated utilizing the electron backscatter diffraction (EBSD) technique. Electron backscatter diffraction patterns are collected from materials with well-known crystal structures, then a deep neural network model is constructed for classification to a specific Bravais lattice or point group. The applicability of this approach is evaluated on diffraction patterns from samples unknown to the computer without any human input or data filtering. This is in comparison to traditional Hough transform EBSD, which requires that you have already determined the phases present in your sample. The internal operations of the neural network are elucidated through visualizing the symmetry features learned by the convolutional neural network. It is determined that the model looks for the same features a crystallographer would use, even though it is not explicitly programmed to do so. This study opens the door to fully automated, high-throughput determination of crystal structures via several electron-based diffraction techniques.

An Acquisition Parameter Study for Machine-Learning-Enabled Electron Backscatter Diffraction

Paradigm shift in electron-based crystallography via machine learning

Algorithm-driven Advances for Scientific CT Instruments: From Model-based to Deep Learning-based Approaches

A Deep Convolutional Neural Network to Analyze Position Averaged Convergent Beam Electron Diffraction Patterns

Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification

Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis

Unsupervised machine learning applied to scanning precession electron diffraction data

Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns

Influence of device configuration and noise on a machine learning predictor for the selection of nanoparticle small-angle X-ray scattering models

Auto-Encoder Neural Network Incorporating X-Ray Fluorescence Fundamental Parameters with Machine Learning

Deep Learning of Structural Morphology Imaged by Scanning X-ray Diffraction Microscopy

A probabilistic deep learning approach to automate the interpretation of multi-phase diffraction spectra

Deconvoluting Thermomechanical Effects in X-ray Diffraction Data using Machine Learning

Physics discovery in nanoplasmonic systems via autonomous experiments in Scanning Transmission Electron Microscopy

Artifact Identification in X-ray Diffraction Data using Machine Learning Methods

Enhancing deep-learning training for phase identification in powder X-ray diffractograms

Advancing electron microscopy using deep learning

Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning

Machine Learning Automated Analysis of Enormous Synchrotron X-ray Diffraction Datasets

Unravelling the components of diffuse scattering using deep learning