A lifetime prediction model for the thermo-electric behaviors of ultracapacitors

Chia-Jui Chiang,Prateek Verma,Wei-Rong Huang
DOI: https://doi.org/10.1016/j.jpowsour.2023.233790
IF: 9.2
2023-11-08
Journal of Power Sources
Abstract:In this paper, a lifetime prediction model, including an equivalent circuit model, a thermal model and an aging model is developed for the prediction of the state of charge (SOC), temperature and state of health (SOH) of the ultracapacitor. The aging model is developed based on the evolution of impedance parameters in the accelerated aging tests conducted at various voltages and temperatures. Based on the fitting results of various aging models for capacitance fade and conductance loss, a power function of the equivalent aging time is chosen for better prediction of the nonlinear aging process including the burning phase and slow aging phase. The consistency and accuracy of the power function aging model allow straightforward implementation in the lifetime prediction model as the equivalent aging time and thus the capacitance, resistance and SOH can be updated with the voltage and temperature of the ultracapacitor at each time step. The experimental results show that the lifetime prediction model is capable of predicting SOC, temperature and SOH of test cells of various aging conditions under three types of charge/discharge current profiles. In the future, the lifetime prediction model can be utilized for the development of predictive estimators and energy management of ultracapacitors.
energy & fuels,materials science, multidisciplinary,electrochemistry,chemistry, physical
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