Abstract:We review recent advances in experimental methods for high spatial-resolution and high time-resolution thermometry, and the application of these and related methods for measurements of thermal transport in low-dimensional structures. Scanning thermal microscopy (SThM) achieves lateral resolutions of 50 nm and a measurement bandwidth of 100 kHz; SThM has been used to characterize differences in energy dissipation in single-wall and multi-wall carbon nanotubes. Picosecond thermoreflectance enables ultrahigh time-resolution in thermal diffusion experiments and characterization of heat flow across interfaces between materials; the thermal conductance G of interfaces between dissimilar materials spans a relatively small range, 20 <G <200 MW m(-2) K-1 near room temperature. Scanning thermoreflectance microscopy provides nanosecond time resolution and submicron lateral resolution needed for studies of heat transfer in microelectronic, opto-electronic and micromechanical systems. A fully-micromachined solid immersion lens has been demonstrated and achieves thermal-radiation imaging with lateral resolution at far below the diffraction limit, <2 mum. Microfabricated metal bridges using electrical resistance thermometry and joule heating give precise data for thermal conductivity of single crystal films, multilayer thin films, epitaxial superlattices, polycrystalline films, and interlayer dielectrics. The room temperature thermal conductivity of single crystal films of Si is strongly reduced for layer thickness below 100 nm. The through-thickness thermal conductivity of Si-Ge and GaAs-AlAs superlattices has recently been shown to be smaller than the conductivity of the corresponding alloy. The 3omega method has been recently extended to measurements of anisotropic conduction in polyimide and superlattices. Data for carbon nanotubes measured using micromachined and suspended heaters and thermometers indicate a conductivity near room temperature greater than diamond.

STEM in situ thermal wave observations for investigating thermal diffusivity in nanoscale materials and devices

Nanosecond nanothermometry in an electron microscope

Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures

Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy.

Thermal Conductivity Imaging at Micrometre-Scale Resolution for Combinatorial Studies of Materials

Nanothermometry of Electrons and Phonons

Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material

Nanoscale spatial resolution probes for Scanning Thermal Microscopy of solid state materials

Thermal Visualization of Buried Interfaces by Transient and Steady-State Responses of Time-Domain Thermoreflectance

Nanoscale Thermal Probing.

Nanoscale imaging of phonon dynamics by electron microscopy

Thermal Visualization of Buried Interfaces Enabled by Ratio Signal and Steady-State Heating of Time-Domain Thermoreflectance

Spatially Resolved Measurements of Thermal Stresses by Picosecond Time-Domain Probe Beam Deflection

A spatially resolved optical method to measure thermal diffusivity

Imaging Local Heating and Thermal Diffusion of Nanomaterials with Plasmonic Thermal Microscopy

Imaging thermal conductivity with nanoscale resolution using a scanning spin probe

A novel nano-scale non-contact temperature measurement technique for crystalline materials

Nanoscale resolution immersion scanning thermal microscopy

Nanoscale thermal imaging of hot electrons by cryogenic terahertz scanning noise microscopy

Quasi-ballistic Thermal Transport from Nanoscale Interfaces Observed Using Ultrafast Coherent Soft X-Ray Beams

Nanoscale thermometry under ambient conditions via scanning thermal microscopy with 3D scanning differential method.