Predicting the Rate of Degradation Related to Oxygen Electrode Delamination in Solid Oxide-Ion Electrolyzers

Yeting Wen,Kevin Huang
DOI: https://doi.org/10.1149/1945-7111/ad3414
IF: 3.9
2024-03-15
Journal of The Electrochemical Society
Abstract:One of the leading causes for the performance degradation in H2-producing solid oxide electrolytic cells (SOECs) is the gradual delamination of oxygen electrode (OE) from the electrolyte under a strong anodic polarization. Identification of the key factor that controls the rate of OE delamination is of paramount importance to achieve long-term stable operation of SOECs. Here we show from thousands of hours of testing data that the exchange current density (io) of OE can be leveraged as a predictor for the rate of delamination. To obtain io, we apply DC-biased electrochemical impedance spectroscopy on a three-electrode symmetrical cell to measure polarization resistance (Rp) of OE as a function of current density (i) and time (t). The collected Rp-i-t raw data are then converted to overpotential ()-i-t, from which io is extracted from the "low-field" approximation. An analytical relationship between io and time-to-delamination (TTD) is further established from the established io-i-t relationship. We show that under a constant anodic polarization current density i, the greater the ratio i/io, the faster the delamination. Therefore, we conclude that the exchange current density of an OE, io, can be used to predict the rate of OE degradation in solid oxide-ion electrolyzers.
electrochemistry,materials science, coatings & films
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