Artificial intelligence/machine learning in manufacturing and inspection: A GE perspective

Kareem S. Aggour,Vipul K. Gupta,Daniel Ruscitto,Leonardo Ajdelsztajn,Xiao Bian,Kristen H. Brosnan,Natarajan Chennimalai Kumar,Voramon Dheeradhada,Timothy Hanlon,Naresh Iyer,Jaydeep Karandikar,Peng Li,Abha Moitra,Johan Reimann,Dean M. Robinson,Alberto Santamaria-Pang,Chen Shen,Monica A. Soare,Changjie Sun,Akane Suzuki,Raju Venkataramana,Joseph Vinciquerra
DOI: https://doi.org/10.1557/mrs.2019.157
IF: 5
2019-07-01
MRS Bulletin
Abstract:Abstract
materials science, multidisciplinary,physics, applied
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