Abstract:Transmission electron microscopy (TEM) is widely used in the materials science community because of its high spatial, temporal and energy resolution. However, for electron beam-sensitive halide perovskites (HPs), the achievements offered by TEM are still in their infancy due to the nonnegligible structural damage caused by the incident electron beams to the fragile structure. Despite these challenges, the potential for TEM to provide unique insights into the microstructure and phase evolution of HPs at the atomic scale, to track the dynamic ion migration behaviors, and to explore the effects of lattice defects on physicochemical properties is still fascinating. In this review, we summarize recent achievements in HPs through advanced analytical methods embedded in the TEM, including high-resolution/scanning TEM (HRTEM/STEM) imaging, electron diffraction (ED) analysis, Xray energy dispersive spectroscopy (EDS), and electron energy-loss spectroscopy (EELS) measurement, and in-situ TEM observation, with the aim of providing a multi-dimensional and multi-scale understanding of the intrinsic properties of HPs that have not yet been discovered. In addition, we delve into the inherent beam-damage mechanisms affecting the delicate HPs crystal, thereby emphasizing the significant hurdles associated with employing TEM in HPs research. Finally, we present a number of effective strategies that may be beneficial in reducing the damage caused by beams. In particular, the introduction of a direct-detection electron-counting (DDEC) camera has contributed significantly to the advancement of low-dose imaging and the suppression of beam damage to the intrinsic structure of HPs. With the improvement of low-dose imaging technology, TEM characterization is expected to promote a comprehensive understanding of the intrinsic properties of HPs in terms of structure-property-performance and to expand the wide range of applications of HPs in optoelectronic devices.

Revealing the microstructures of metal halide perovskite thin films via advanced transmission electron microscopy

Low-dose Transmission Electron Microscopy Study on Halide Perovskites: Application and Challenges

Transformation and Degradation of Metal Halide Perovskites Induced by Energetic Electrons and Their Practical Implications

Atomic Level Insights into Metal Halide Perovskite Materials by Scanning Tunneling Microscopy and Spectroscopy

Challenges, Myths, and Opportunities of Electron Microscopy on Halide Perovskites

Atomic‐Resolution Imaging of Halide Perovskites Using Electron Microscopy

Atomically unraveling the structural evolution of surfaces and interfaces in metal halide perovskite quantum dots

Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

On-Chip Light-Incorporated In Situ Transmission Electron Microscopy of Metal Halide Perovskite Materials

Progress on Growth of Metal Halide Perovskites by Vapor-Phase Synthesis and Their Applications

Fabrication Strategies and Optoelectronic Applications of Perovskite Heterostructures

Metal Halide Perovskites Functionalized by Patterning Technologies

Thermally Evaporated Metal Halide Perovskites and Their Analogues: Film Fabrication, Applications and Beyond

Transmission electron microscopy studies of organic–inorganic hybrid perovskites: Advances, challenges, and prospects

Exploring the Relationship of Microstructure and Conductivity in Metal Halide Perovskites via Active Learning-Driven Automated Scanning Probe Microscopy

Stability improvements of metal halide perovskite nanocrystals and their optoelectrical applications

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Disentangling Electronic Transport and Hysteresis at Individual Grain Boundaries in Hybrid Perovskites via Automated Scanning Probe Microscopy

Unveiling the Intrinsic Structure and Intragrain Defects of Organic Inorganic Hybrid Perovskites by Ultra‐low Dose Transmission Electron Microscopy

Metal Halide Perovskite/2D Material Heterostructures: Syntheses and Applications

Exploring the microstructural origins of conductivity and hysteresis in metal halide perovskites via active learning driven automated scanning probe microscopy