Abstract:Fluorescent patterns with multiple functions enable high-security anti-counterfeiting labels. Complex material synthesis and patterning processes limit the application of multifunctional fluorescent patterns, so the technology of in situ fluorescent patterning with tunable multimodal capabilities is becoming more necessary. In this work, an in situ fluorescent patterning technology was developed using laser direct writing on solid cellulose film at ambient conditions without masks. The fluorescent intensity and surface microstructure of the patterns could be adjusted by programmable varying of the laser parameters simultaneously. During laser direct writing, carbon dots are generated in situ in a cellulose ester polymer matrix, which significantly simplifies the fluorescent patterning process and reduces the manufacturing cost. Interestingly, the tunable fluorescent intensity empowers the fabrication of visual stereoscopic fluorescent patterns with excitation dependence, further improving its anti-counterfeiting performance. The obtained fluorescent patterns still show ultrahigh optical properties after being immersed in an acid/base solution (pH 5–12) over one month. In addition, the anti-UV performance of the obtained laser-patterned film with transmittance around 90% is comparable to that of commercial UV-resistant films. This work provided an advanced and feasible approach to fabricating programmable, performance-tunable, subtle fluorescent patterns in large-scale for industrial application.The Supporting Information is available free of charge at https://pubs.acs.org/doi/10.1021/acsnano.1c09999.Details of the laser writing process, fluorescent patterns prepared by in situ laser writing, characterization of laser-written CAB film and CAB powder, study of surface average temperature during the laser writing process, optical stability of the fluorescent patterns, X-ray photoelectron spectroscopy (XPS) of CAB, transmission electron microscopy (TEM) of CDs produced at different laser scan rates, and analysis of emission gas during the laser direct writing process and figures of pyrolysis gas emission during laser writing process, scan rate and scan time relationship, plot of etch depth vs log (fluence) in laser ablation of CAB, fluorescent patterns, FTIR spectrum, DSC curve, peak and average surface temperature of the laser writing area vs scan rate, solid-state photoluminescence intensity of laser-directed patterned area, X-ray photoelectron spectroscopy patterns, TEM images, and GC–MS spectrum (PDF)This article has not yet been cited by other publications.

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