Fingerprinting Defects in Hexagonal Boron Nitride via Multi‐Phonon Excitation

Pablo Tieben,Andreas W. Schell
DOI: https://doi.org/10.1002/adom.202302700
IF: 9
2024-04-11
Advanced Optical Materials
Abstract:Phonon‐assisted excitation is conducted on a large number of single photon emitters in hexagonal boron nitride. For the majority of emitters in the yellow emission region a predominant coupling to a single phonon mode can be observed. This observation prevails at large detunings from the zero‐phonon line of up to four phonon energies, allowing for conclusions about the underlying atomic defect. Single photon emitters in hexagonal boron nitride (hBN) have gathered a lot of attention due to their favorable emission properties and the manifold of possible applications. Despite extensive scientific effort, the exact atomic origin of these emitters has remained unknown thus far. Recently, several studies have tied the emission in the yellow spectral region to carbon‐related defects, but the exact atomic structure of the defects remains elusive. In this study, photoluminescence emission and excitation spectroscopy is performed on a large number of emitters within this region. By comparing the experimental data with theoretical predictions, the origin of yellow single photon emission in hexagonal boron nitride is determined. Knowledge of this atomic structure and its optical properties is crucial for the reliable implementation of these emitters in quantum technologies.
materials science, multidisciplinary,optics
What problem does this paper attempt to address?