Super-Resolution Imaging and Microscopy by Dielectric Particle-Lenses

Zengbo Wang,Boris Luk’yanchuk
DOI: https://doi.org/10.1007/978-3-030-21722-8_15
2019-01-01
Abstract:Resolutionsuper-Imagingsuper-resolutionLensdielectric particle-Super resolution dielectric Lensdielectric particle- emerged recently as a simple solution to obtaining Resolutionsuper- images of nanoscale devices and structures. Calibrated resolution of ~documentclass[12pt]{minimal}usepackage{amsmath}usepackage{wasysym}usepackage{amsfonts}usepackage{amssymb}usepackage{amsbsy}usepackage{mathrsfs}usepackage{upgreek}setlength{oddsidemargin}{-69pt}egin{document}$$ lambda /6 $$end{document}–documentclass[12pt]{minimal}usepackage{amsmath}usepackage{wasysym}usepackage{amsfonts}usepackage{amssymb}usepackage{amsbsy}usepackage{mathrsfs}usepackage{upgreek}setlength{oddsidemargin}{-69pt}egin{document}$$ lambda /8 $$end{document} has been demonstrated, making it possible to directly visualize 15–50 nm scale objects under a white light illumination. The technique has undergone rapid developments in recent years. Major advances such as the development of surface scanning functionalities, higher resolution MetamaterialsSuperlensmetamaterial, biological Superlensbiological and integrated bio-chips as well as new applications in Interferometry, Endoscopy and others, have been reported. This chapter aims to provide an overall review of the technique including its background, fundamentals and key progresses. The outlook of the technique is finally discussed.
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