Manipulating Oxidation of Silicon with Fresh Surface Enabling Stable Battery Anode

Gaofeng Ge,Guocheng Li,Xiancheng Wang,Xiaoxue Chen,Lin Fu,Xiaoxiao Liu,Eryang Mao,Jing Liu,Xuelin Yang,Chenxi Qian,Yongming Sun
DOI: https://doi.org/10.1021/acs.nanolett.1c00317
IF: 10.8
2021-03-18
Nano Letters
Abstract:Silicon (Si)-based material is a promising anode material for next-generation lithium-ion batteries (LIBs). Herein, we report the fabrication of a silicon oxide–carbon (SiO<sub><i>x</i></sub>/C) nanocomposite through the reaction between silicon particles with fresh surface and H<sub>2</sub>O in a mild hydrothermal condition, as well as conducting carbon coating synchronously. We found that controllable oxidation could be realized for Si particles to produce uniform SiO<sub><i>x</i></sub> after the removal of the native passivation layer. The uniform oxidation and conductive coating offered the as-fabricated SiO<sub><i>x</i></sub>/C composite good stability at both particle and electrode level over electrochemical cycling. The as-fabricated SiO<sub><i>x</i></sub>/C composite delivered a high reversible capacity of 1133 mAh g<sup>–1</sup> at 0.5 A g<sup>–1</sup> with 89.1% capacity retention after 200 cycles. With 15 wt % SiO<sub><i>x</i></sub>/C composite, graphite-SiO<sub><i>x</i></sub>/C hybrid electrode displayed a high reversible specific capacity of 496 mAh g<sup>–1</sup> and stable electrochemical cycling with a capacity retention of 90.1% for 100 cycles.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acs.nanolett.1c00317?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acs.nanolett.1c00317</a>.Experimental details and additional characterizations (<a class="ext-link" href="/doi/suppl/10.1021/acs.nanolett.1c00317/suppl_file/nl1c00317_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
What problem does this paper attempt to address?