Abstract:Due to sensor malfunctions and data transmission corruptions, the industrial process data collected commonly contain missing values. It poses a significant challenge for data-driven approaches in aggregating temporal-spatial correlations that reflect dependencies across both variables and times, which makes it difficult to directly carry out downstream industrial operational applications. In this study, a self-supervised representation learning model is proposed to extract probabilistic temporal-spatial latent variables (LVs) from sequential data under missing value interference. The extracted LVs can be utilized for typical industrial operational applications through a unified framework. First, a novel deep dynamic probabilistic latent variable model, named Markov dynamic variational autoencoder (MD-VAE), is proposed to explicitly model the temporal-spatial dependencies between LVs. The latent posteriors are Bayesian smoothed by global sequence information for effective variational inference (VI). Second, a self-supervised learning approach, termed masked MD-VAE (), is proposed to address the challenge of directly extracting temporal-spatial LVs under missing value interference. Controllable constraints with practical interpretations are introduced to balance the latent bottleneck capacity with reconstruction accuracy during model optimization. A unified framework is proposed to utilize the latent representations for typical industrial downstream tasks. Case studies conducted on a real-world multiphase flow process demonstrate the superiority of in unsupervised industrial operational applications including missing value imputation and dynamic process monitoring under missing value interference.

A Dynamic Latent Structure With Time-Varying Parameters for Virtual Sensing of Industrial Process With Irregular Missing Data

Virtual sensing techniques for nonlinear dynamic processes using weighted probability dynamic dual-latent variable model and its industrial applications

Long-short Memory with Feature Representation by Latent-variable Model for Industrial Soft Sensor

Robust Dynamic Latent Variable Model for Dynamic Process Monitoring with Missing Data in Cyber-Physical Systems

Robust Mixture Bayesian Latent Variable Regression with Structural Sparsity and Application to Inferential Sensing of Quality Variables

An Error-in-variable Projection to Latent Structure Framework for Monitoring Technical Systems with Orthogonal Signal Components

Dynamic Probabilistic Latent Variable Model for Process Data Modeling and Regression Application

Virtual Sensing for Dynamic Industrial Process Based on Localized Linear Dynamical System Models with Time-Delay Optimization.

A Probabilistic Just-in-Time Learning Framework for Soft Sensor Development with Missing Data

Autoregressive Dynamic Latent Variable Models for Process Monitoring

Spatio‐temporal Adaptive Soft Sensor for Nonlinear Time‐varying and Variable Drifting Processes Based on Moving Window LWPLS and Time Difference Model

Industrial Virtual Sensing for Big Process Data Based on Parallelized Nonlinear Variational Bayesian Factor Regression

Enhancing the Reliability and Accuracy of Data-Driven Dynamic Soft Sensor Based on Selective Dynamic Partial Least Squares Models

A Novel Streaming Variational Bayesian Supervised Factor Analysis For Industrial Adaptive Soft Sensor Modeling

Recursive Autoregressive Dynamic Latent Variable Model for Fault Detection of Dynamic Process with Missing Values

Refining data-driven soft sensor modeling framework with variable time reconstruction

Semi-Supervised Deep Dynamic Probabilistic Latent Variable Model for Multimode Process Soft Sensor Application

Weighted Linear Dynamic System for Feature Representation and Soft Sensor Application in Nonlinear Dynamic Industrial Processes.

Dynamic Variational Bayesian Student's T Mixture Regression With Hidden Variables Propagation for Industrial Inferential Sensor Development

Semi-supervised Mixture of Latent Factor Analysis Models with Application to Online Key Variable Estimation

M 2 D-VAE: Self-Supervised Probabilistic Temporal- Spatial Latent Representation Learning for Unsupervised Industrial Operational Applications Under Missing Value Interference