High‐sensitive and fast MXene/silicon photodetector for single‐pixel X‐ray imaging
Yance Chen,Yue Dai,Srikrishna Chanakya Bodepudi,Xinyu Liu,Yuan Ma,Shiyu Xing,Dawei Di,Feng Tian,Xin Ming,Yingjun Liu,Kai Pang,Fei Xue,Yunyan Zhang,Zexin Yu,Yaping Dan,Oleksiy V. Penkov,Yishu Zhang,Dianyu Qi,Wenzhang Fang,Yang Xu,Chao Gao
DOI: https://doi.org/10.1002/inf2.12596
2024-06-27
InfoMat
Abstract:A free‐standing and high‐quality Ti3C2Tx MXene nanofilm is prepared via macro‐assembly, pairing with single‐crystal silicon for a high‐sensitive and fast X‐ray detector. By utilizing single‐pixel imaging technology, we can achieve sharp images with low X‐ray dose, expected to be applied in future medical imaging The demand for high‐performance X‐ray detectors leads to material innovation for efficient photoelectric conversion and carrier transfer. However, current X‐ray detectors are often susceptible to chemical and irradiation instability, complex fabrication processes, hazardous components, and difficult compatibility. Here, we investigate a two‐dimensional (2D) material with a relatively low atomic number, Ti3C2Tx MXenes, and single crystal silicon for X‐ray detection and single‐pixel imaging (SPI). We fabricate a Ti3C2Tx MXene/Si X‐ray detector demonstrating remarkable optoelectronic performance. This detector exhibits a sensitivity of 1.2 × 107 μC Gyair−1 cm−2, a fast response speed with a rise time of 31 μs, and an incredibly low detection limit of 2.85 nGyair s−1. These superior performances are attributed to the unique charge coupling behavior under X‐ray irradiation via intrinsic polaron formation. The device remains stable even after 50 continuous hours of high‐dose X‐ray irradiation. Our device fabrication process is compatible with silicon‐based semiconductor technology. Our work suggests new directions for eco‐friendly X‐ray detectors and low‐radiation imaging system.
materials science, multidisciplinary